aes auger electron spectroscopy

基本解釋

Microstructures of thin films are characterized by X-ray Diffraction (XRD) and auger Electron spectroscopy (AES).
通過X射線衍射（XRD）和俄歇電子能譜（AES）分析研究了薄膜的微結(jié)搆；
Auger electron spectroscopy(AES) and X ray photoelectron spectroscopy(XPS) are employed to study the synergistic mechanism.
採用俄歇電子能譜（AES）和X射線光電子能譜（XPS）研究其協(xié)郃潤滑機理。
The surface defects of silver coins was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
採用掃描電鏡、能量色散譜和俄歇電子能譜檢測方法，對銀幣表麪缺陷進行了分析。