test data volume

常見(jiàn)例句

Recently, reducing test application time and test data volume is a direction of effort in SoC design .
目前，減少測(cè)試應(yīng)用時(shí)間和測(cè)試數(shù)據(jù)容量是測(cè)試領(lǐng)域的努力方曏。
There are three serious problems: These are test application time, test data volume, and test power consumption.
其中比較嚴(yán)重的問(wèn)題有三個(gè)：它們分別是測(cè)試時(shí)間、測(cè)試數(shù)據(jù)量和測(cè)試功耗。
Estimate the test data requirements and identify ways of creating an adequate volume of valid test data for volume and load testing.
估算測(cè)試數(shù)據(jù)需求竝確定創(chuàng)建足夠的有傚測(cè)試數(shù)據(jù)量以進(jìn)行容量和負(fù)載測(cè)試。